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Vlsi Test Principles And Architectures: Design For Testability (Morgan Kaufmann Series In Systems On Silicon (Hardcover))-new Kokichi Katsu The Postmodern SitutationThis Book Is A Comprehensive Guide To New Dft Methods That Will Show The Readers How To Design A Testable And Quality Product, Drive Down Test Cost, Improve Product Quality And Yield, And Speed Up Timetomarket And Timetovolume. Most Uptodate Coverage Of Design For Testability. Coverage Of Industry Practices Commonly Found In Commercial Dft Tools But Not Discussed In Other Books. Numerous, Practical Examples In Each Chapter Illustrating Basic Vlsi Test