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SCAN(ARM-B) 1
TEL Tokyo Electron Part No: 3D86-000485-V4
Inventory # A-10161
Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System
Inventory # AA-2636
Nikon Reflectance Plate NSR-S307E 300mm DUV Scanning System Working Surplus SCAN(ARM-B) 1Nikon Reflectance Plate NSR S307E 300mm DUV Scanning System Working Surplus Part No: Reflectance Sensor Removed from a Nikon NSR S307E 300mm DUV Scanning System This Nikon Reflectance Plate is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working Surplus, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 10"x10"x10" @ 10 lbs. Shipping Terms: All Domestic
